Wafer Map Support
Usage Guide
Field bindings
- Wafer hierarchy: Optional grouping hierarchy for wafers, lots, or other drill levels.
- Die X: Required. The X coordinate in XY mode, or the sequence/order field when Die Y is not bound.
- Die Y: Optional. When bound, Wafer Map renders true XY coordinates. When not bound, it uses X-only sequence mode.
- Die Value: Optional. Numeric or categorical values used to color dies. Multiple fields can be bound and swapped from the toolbar.
- Die Classification: Optional. Classification, bin, status, or pass/fail fields used for categorical coloring and yield metrics.
- Count: Optional measure. Bind this when your model may contain aggregated rows and you need to compare displayed die rows with total die count.
Important: Wafer Map assumes the provided hierarchy and die X/Y mapping resolve to raw die-level data. If Power BI has already rolled up the data, the distribution and statistics may not represent raw dies because they are calculated from the rows provided to the visual. To check this, bind a count measure to Count and confirm that Displayed Dies matches Total Dies in the status panel.
Toolbar
- Magnifying glass: Zoom and pan mode.
- Square: Brush selection mode. Drag over dies to select them in Power BI.
- Reset arrow: Reset zoom, focus, and brush selection.
- Swap arrows: Switch the displayed encoding when multiple value or classification fields are bound.
- Pass / Fail: Highlight passing or failing dies when pass/fail classification can be resolved.
Legend and status panel
- Click a categorical or binned legend item to focus that bucket. Click it again to clear focus.
- Double-click empty toolbar or status panel space to clear legend focus.
- The status panel shows the active scope, selected encoding, distribution chart, summary statistics, process limits, and legend.
- Click wafer labels or section headers to focus the distribution and statistics on that wafer or hierarchy section.
FAQ
What is Wafer Map?
Wafer Map is a Power BI custom visual for semiconductor wafer maps, die value maps, bin maps, and yield-loss review. It renders die-level rows by wafer hierarchy, die coordinates, die value, and optional classification fields so engineers can inspect wafer patterns inside standard Power BI reports.
Why does my wafer map show fewer rows than the dataset?
Wafer Map receives data after Power BI applies report filters, visual filters, bindings, aggregation, drill state, and data reduction. In unlicensed production trial mode, Wafer Map processes only the first 1000 input rows and shows an in-visual diagnostic when rows are limited.
Which fields should I bind?
Bind dieX for the die X coordinate and, for true 2D wafer maps, bind dieY for the die Y coordinate. Bind waferId when you need wafer, lot, or hierarchy grouping. Bind dieValue for the value rendered in each die cell, and optionally bind classification fields for status or category overlays. Missing waferId is valid and renders valid rows under one default wafer.
Why does the visual show a diagnostic message?
Wafer Map validates the current field bindings and input rows before rendering. Diagnostics can appear for missing required coordinate roles, unusable coordinate values, duplicate wafer-coordinate rows after Power BI aggregation, trial row limiting, or settings that prevent the current data shape from being drawn.
If a diagnostic appears after changing fields or settings, check that dieX and dieY are bound as coordinates, dieValue is a measure or value appropriate for the current map, and the current Power BI drill level contains the wafer hierarchy rows you expect.
How are duplicate die coordinates handled?
Power BI should provide one aggregated row for each wafer hierarchy path and die coordinate. If Wafer Map receives duplicate rows for the same wafer hierarchy, dieX, and dieY position, it reports a contract diagnostic instead of aggregating raw die values inside the visual.
Does Wafer Map parse semiconductor files?
No. Wafer Map does not parse STDF, KLARF, SINF, SEMI E142, or other semiconductor file formats. Prepare die-level tabular data upstream in Power BI, MES/YMS, ETL, or query tooling, then bind the resulting fields to the visual.
Does Wafer Map send report data to external services?
No report data is stored on developer-controlled servers or sent to developer-controlled external services. Processing happens inside the user's Power BI visual session. See the privacy document for details.